Device Under Test (DUT)/unit under test (UUT)

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Definition - What does Device Under Test (DUT) mean?

A device under test (DUT) is a device that is tested to determine performance and proficiency. A DUT also may be a component of a bigger module or unit known as a unit under test (UUT). A DUT is checked for defects to make sure the device is working. The testing is designed to prevent damaged devices from entering the market, which also may reduce manufacturing costs.

A DUT is usually tested by automatic or automated test equipment (ATE), which may be used to conduct simple or complex testing, depending on the device tested. ATEs may include testing performed on software, hardware, electronics, semiconductors or avionics.

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Techopedia explains Device Under Test (DUT)

The majority of high-tech ATE structures utilize automation for quick test execution. Automation uses IT and control systems to limit human interaction. Depending on the module used during testing, the DUT can be attached to the ATE using a variety of connectors, such as pogo pins, a bed of nails tester, microscopic needles and zero insertion force (ZIF) sockets or contactors.

Because there are a wide variety of DUTs, testing procedures vary. However, in all DUT testing, if a first out-of-tolerance value is identified, the testing stops immediately and the DUT fails the assessment.

There are different DUT testing types. Such testing is applied to semiconductors, overall electronics or other devices.

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A device under test (DUT), also known as equipment under test (EUT) and unit under test (UUT), is a manufactured product undergoing testing, either at first manufacture or later during its life cycle as part of ongoing functional testing and calibration checks. This can include a test after repair to establish that the product is performing in accordance with the original product specification.

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Electronics testing
In the electronics industry a DUT is any electronic assembly under test.[1][2] For example, cell phones coming off of an assembly line may be given a final test in the same way as the individual chips were earlier tested. Each cell phone under test is, briefly, the DUT.

For circuit boards, the DUT is often connected to the test equipment using a bed of nails tester of pogo pins.

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Semiconductor testing
In semiconductor testing, the device under test is a die on a wafer or the resulting packaged part. A connection system is used, connecting the part to automatic or manual test equipment. The test equipment then applies power to the part, supplies stimulus signals, then measures and evaluates the resulting outputs from the device. In this way, the tester determines whether the particular device under test meets the device specifications.

While packaged as a wafer, automatic test equipment (ATE) can connect to the individual units using a set of microscopic needles. Once the chips are sawn apart and packaged, test equipment can connect to the chips using ZIF sockets (sometimes called contactors).